Presentation
Selection of test techniques for high-resolution ΣΔ modulators
Author/s | Guerra Vinuesa, Oscar
![]() ![]() ![]() ![]() ![]() ![]() Escalera Morón, Sara Rosa Utrera, José Manuel de la ![]() ![]() ![]() ![]() ![]() ![]() ![]() Compaigne, Eric Galliard, Christophe Rodríguez Vázquez, Ángel Benito ![]() ![]() ![]() ![]() ![]() ![]() ![]() |
Department | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Publication Date | 2000 |
Deposit Date | 2018-11-09 |
Published in |
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ISBN/ISSN | 2-9522971-0-X |
Abstract | This paper introduces a new tool which allows the
evaluation of different test techniques in a complete impartial
manner. This tool has been applied to the selection of the best
test technique for their application to ... This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. Index Terms—ΣΔ modulators, Test Techniques. |
Funding agencies | European Union (UE) Comisión Interministerial de Ciencia y Tecnología (CICYT). España |
Project ID. | 2001-34283/TAMES_2
![]() TIC- 2001-0929/ADAVERE ![]() |
Citation | Guerra Vinuesa, O., Escalera Morón, S., Rosa Utrera, J.M.d.l., Compaigne, E., Galliard, C. y Rodríguez Vázquez, Á.B. (2000). Selection of test techniques for high-resolution ΣΔ modulators. En Conference on Design of Circuits and Integrated Systems, Bordeaux (Francia). |
Files | Size | Format | View | Description |
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Selection of test.pdf | 210.2Kb | ![]() | View/ | |