Ponencia
Selection of test techniques for high-resolution ΣΔ modulators
Autor/es | Guerra Vinuesa, Oscar
Escalera Morón, Sara Rosa Utrera, José Manuel de la Compaigne, Eric Galliard, Christophe Rodríguez Vázquez, Ángel Benito |
Departamento | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Fecha de publicación | 2000 |
Fecha de depósito | 2018-11-09 |
Publicado en |
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ISBN/ISSN | 2-9522971-0-X |
Resumen | This paper introduces a new tool which allows the
evaluation of different test techniques in a complete impartial
manner. This tool has been applied to the selection of the best
test technique for their application to ... This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. Index Terms—ΣΔ modulators, Test Techniques. |
Agencias financiadoras | European Union (UE) Comisión Interministerial de Ciencia y Tecnología (CICYT). España |
Identificador del proyecto | 2001-34283/TAMES_2
TIC- 2001-0929/ADAVERE |
Cita | Guerra Vinuesa, O., Escalera Morón, S., Rosa Utrera, J.M.d.l., Compaigne, E., Galliard, C. y Rodríguez Vázquez, Á.B. (2000). Selection of test techniques for high-resolution ΣΔ modulators. En Conference on Design of Circuits and Integrated Systems, Bordeaux (Francia). |
Ficheros | Tamaño | Formato | Ver | Descripción |
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Selection of test.pdf | 210.2Kb | [PDF] | Ver/ | |