Selection of test techniques for high-resolution ΣΔ modulators

Guerra Vinuesa, Oscar; Escalera Morón, Sara; Rosa Utrera, José Manuel de la; Compaigne, Eric; Galliard, Christophe; Rodríguez Vázquez, Ángel Benito

Ponencia

dc.creator	Guerra Vinuesa, Oscar	es
dc.creator	Escalera Morón, Sara	es
dc.creator	Rosa Utrera, José Manuel de la	es
dc.creator	Compaigne, Eric	es
dc.creator	Galliard, Christophe	es
dc.creator	Rodríguez Vázquez, Ángel Benito	es
dc.date.accessioned	2018-11-09T13:09:22Z
dc.date.available	2018-11-09T13:09:22Z
dc.date.issued	2000
dc.identifier.citation	Guerra Vinuesa, O., Escalera Morón, S., Rosa Utrera, J.M.d.l., Compaigne, E., Galliard, C. y Rodríguez Vázquez, Á.B. (2000). Selection of test techniques for high-resolution ΣΔ modulators. En Conference on Design of Circuits and Integrated Systems, Bordeaux (Francia).
dc.identifier.isbn	2-9522971-0-X	es
dc.identifier.uri	https://hdl.handle.net/11441/79997
dc.description.abstract	This paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. Index Terms—ΣΔ modulators, Test Techniques.	es
dc.description.sponsorship	Unión Europea ESPRIT IST 2001-34283/TAMES_2	es
dc.description.sponsorship	Ministerio de Educación y Ciencia CICYT TIC- 2001-0929/ADAVERE	es
dc.format	application/pdf	es
dc.language.iso	eng	es
dc.relation.ispartof	Conference on Design of Circuits and Integrated Systems (2000), p 211-214
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internacional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.title	Selection of test techniques for high-resolution ΣΔ modulators	es
dc.type	info:eu-repo/semantics/conferenceObject	es
dcterms.identifier	https://ror.org/03yxnpp24
dc.type.version	info:eu-repo/semantics/acceptedVersion	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo	es
dc.relation.projectID	2001-34283/TAMES_2	es
dc.relation.projectID	TIC- 2001-0929/ADAVERE	es
idus.format.extent	4 p.	es
dc.publication.initialPage	211	es
dc.publication.endPage	214	es
dc.eventtitle	Conference on Design of Circuits and Integrated Systems	es
dc.eventinstitution	Bordeaux (Francia)	es
dc.contributor.funder	European Union (UE)
dc.contributor.funder	Comisión Interministerial de Ciencia y Tecnología (CICYT). España

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