Repositorio de producción científica de la Universidad de Sevilla

Computer Integrated Manufacturing in Semiconductor Industry. Automation, Electronic Wafer Mapping, Defect Reduction and Equipment Utilization Improvement in Probe and Final Test

 

Advanced Search
 
Opened Access Computer Integrated Manufacturing in Semiconductor Industry. Automation, Electronic Wafer Mapping, Defect Reduction and Equipment Utilization Improvement in Probe and Final Test
Cites
Show item statistics
Icon
Export to
Author: Moreno Lizaranzu, Manuel José
Director: Cuesta Rojo, Federico
Department: Universidad de Sevilla. Departamento de Ingeniería de Sistemas y Automática
Date: 2012
Document type: Doctoral Thesis
Abstract: La industria de semiconductores presenta arduos problemas en ... Dispositivos para la industria del automóvil y médica deben tener una tasa de defectos muy baja. Pruebas eléctricas e inspecciones visuales se aplican para detectar dispositivos defectuosos
Cite: Moreno Lizaranzu, M.J. (2012). Computer Integrated Manufacturing in Semiconductor Industry. Automation, Electronic Wafer Mapping, Defect Reduction and Equipment Utilization Improvement in Probe and Final Test. (Tesis Doctoral Inédita). Universidad de Sevilla, Sevilla.
Size: 6.840Mb
Format: PDF

URI: http://hdl.handle.net/11441/15246

This work is under a Creative Commons License: 
Atribución-NoComercial-SinDerivadas 4.0 España

This item appears in the following Collection(s)