Ponencia
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
Autor/es | Escalera Morón, Sara
García González, José Manuel Guerra Vinuesa, Oscar Rosa Utrera, José Manuel de la Medeiro Hidalgo, Fernando Pérez Verdú, Belén Rodríguez Vázquez, Ángel Benito |
Departamento | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Fecha de publicación | 2004 |
Fecha de depósito | 2019-08-30 |
Publicado en |
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Resumen | In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of ... In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach. |
Cita | Escalera Morón, S., García González, J.M., Guerra Vinuesa, O., Rosa Utrera, J.M.d.l., Medeiro Hidalgo, F., Pérez Verdú, B. y Rodríguez Vázquez, Á.B. (2004). An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators. En Proceeding of the 2004 International Symposium on Circuits and Systems (ISCAS) (I.257-I.260), Vancouver, Canadá: Institute of Electrical and Electronics Engineers. |
Ficheros | Tamaño | Formato | Ver | Descripción |
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AN ALTERNATIVE DFT METHODOLOGY.pdf | 405.4Kb | [PDF] | Ver/ | |