Artículo
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
Autor/es | Saraza Canflanca, Pablo
Díaz Fortuny, J. Castro López, R. Roca, E. Martín Martínez, J. Rodríguez, R. Nafria, M. Fernández Fernández, Francisco Vidal |
Departamento | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Fecha de publicación | 2020-05 |
Fecha de depósito | 2023-09-19 |
Publicado en |
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Resumen | In the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, phenomena such as Bias Temperature Instability, Hot-Carrier Injection and Random Telegraph Noise ... In the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, phenomena such as Bias Temperature Instability, Hot-Carrier Injection and Random Telegraph Noise can largely affect circuit reliability. It becomes therefore imperative to develop reliability-aware design tools to mitigate their impact on circuits. To this end, these phenomena must be first accurately characterized and modeled. And, since all these phenomena reveal a stochastic nature for deeply-scaled integration technologies, they must be characterized massively on devices to extract the probability distribution functions associated to their characteristic parameters. In this work, a complete methodology to characterize these phenomena experimentally, and then extract the necessary parameters to construct a Time-Dependent Variability model, is presented. This model can be used by a reliability simulator. © 2020 Elsevier B.V. |
Agencias financiadoras | Ministerio de Economia, Industria y Competitividad (MINECO). España European Commission (EC). Fondo Europeo de Desarrollo Regional (FEDER) European Union (UE) Agencia Estatal de Investigación (AEI). España |
Identificador del proyecto | BES2017-080160
TEC2016- 75151-C3-R |
Cita | Saraza Canflanca, P., Díaz Fortuny, J., Castro López, R., Roca, E., Martín Martínez, J., Rodríguez, R.,...,Fernández Fernández, F.V. (2020). A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level. Integration, 72, 13-20. https://doi.org/10.1016/j.vlsi.2020.02.002. |
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