dc.creator | Saraza Canflanca, Pablo | es |
dc.creator | Díaz Fortuny, J. | es |
dc.creator | Castro López, R. | es |
dc.creator | Roca, E. | es |
dc.creator | Martín Martínez, J. | es |
dc.creator | Rodríguez, R. | es |
dc.creator | Nafria, M. | es |
dc.creator | Fernández Fernández, Francisco Vidal | es |
dc.date.accessioned | 2023-09-19T08:45:06Z | |
dc.date.available | 2023-09-19T08:45:06Z | |
dc.date.issued | 2020-05 | |
dc.identifier.citation | Saraza Canflanca, P., Díaz Fortuny, J., Castro López, R., Roca, E., Martín Martínez, J., Rodríguez, R.,...,Fernández Fernández, F.V. (2020). A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level. Integration, 72, 13-20. https://doi.org/10.1016/j.vlsi.2020.02.002. | |
dc.identifier.issn | 0167-9260 | es |
dc.identifier.issn | 1872-7522 | es |
dc.identifier.uri | https://hdl.handle.net/11441/148995 | |
dc.description.abstract | In the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, phenomena such as Bias Temperature Instability, Hot-Carrier Injection and Random Telegraph Noise can largely affect circuit reliability. It becomes therefore imperative to develop reliability-aware design tools to mitigate their impact on circuits. To this end, these phenomena must be first accurately characterized and modeled. And, since all these phenomena reveal a stochastic nature for deeply-scaled integration technologies, they must be characterized massively on devices to extract the probability distribution functions associated to their characteristic parameters. In this work, a complete methodology to characterize these phenomena experimentally, and then extract the necessary parameters to construct a Time-Dependent Variability model, is presented. This model can be used by a reliability simulator. © 2020 Elsevier B.V. | es |
dc.description.sponsorship | Ministerio de Economia, Industria y Competitividad (MINECO). España BES2017-080160 | es |
dc.description.sponsorship | European Commission (EC). Fondo Europeo de Desarrollo Regional (FEDER) TEC2016- 75151-C3-R | es |
dc.description.sponsorship | European Union (UE) TEC2016- 75151-C3-R | es |
dc.description.sponsorship | Agencia Estatal de Investigación (AEI). España TEC2016- 75151-C3-R | es |
dc.format | application/pdf | es |
dc.format.extent | 10 | es |
dc.language.iso | eng | es |
dc.publisher | Elsevier B.V. | es |
dc.relation.ispartof | Integration, 72, 13-20. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | Bias temperature instability | es |
dc.subject | BTI | es |
dc.subject | Characterization | es |
dc.subject | CMOS | es |
dc.subject | HCI | es |
dc.subject | Hot-carrier injection | es |
dc.subject | Random telegraph noise | es |
dc.subject | Reliability | es |
dc.subject | RTN | es |
dc.subject | Simulation | es |
dc.subject | TDV | es |
dc.subject | Time-dependent variability | es |
dc.title | A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/acceptedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo | es |
dc.relation.projectID | BES2017-080160 | es |
dc.relation.projectID | TEC2016- 75151-C3-R | es |
dc.relation.publisherversion | https://doi.org/10.1016/j.vlsi.2020.02.002 | es |
dc.identifier.doi | 10.1016/j.vlsi.2020.02.002 | es |
dc.journaltitle | Integration | es |
dc.publication.volumen | 72 | es |
dc.publication.initialPage | 13 | es |
dc.publication.endPage | 20 | es |
dc.contributor.funder | Ministerio de Economia, Industria y Competitividad (MINECO). España | es |
dc.contributor.funder | European Commission (EC). Fondo Europeo de Desarrollo Regional (FEDER) | es |
dc.contributor.funder | European Union (UE) | es |
dc.contributor.funder | Agencia Estatal de Investigación (AEI). España | es |