dc.creator | Barragán-Villarejo, Manuel | es |
dc.creator | Léger, Gildas | es |
dc.creator | Rueda Rueda, Adoración | es |
dc.creator | Huertas Díaz, José Luis | es |
dc.date.accessioned | 2017-11-22T18:08:13Z | |
dc.date.available | 2017-11-22T18:08:13Z | |
dc.date.issued | 2011-01-06 | |
dc.identifier.citation | Barragán Villarejo, M., Leger Leger, G., Rueda Rueda, A. y Huertas Díaz, J.L. (2011). Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures. Journal of Electronic Testing, 27 (3), 277-288. | |
dc.identifier.issn | 0923-8174 (impreso) | es |
dc.identifier.uri | http://hdl.handle.net/11441/66491 | |
dc.description.abstract | This paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the Device Under Test (DUT) to a two-tone input signal. The envelope signal is processed to obtain a digital signature sensitive to key specifications of the DUT. An optimized regression model based on ensemble learning is used to relate the digital signatures to the target specifications. A new Figure of Merit (FOM) is proposed to evaluate the prediction accuracy of the statistical model, and a demonstrator has been developed to prove the feasibility of the approach. This demonstrator features a 2.445 GHz low-power LNA and a simple envelope detector, and has been developed in a 90 nm CMOS technology. Post-layout simulations are provided to verify the functionality of the proposed test technique. | es |
dc.description.sponsorship | Gobierno de España TEC2007-68072/MIC, TSI-020400-2008-71/MEDEA+2A105, CATRENE CT302 | es |
dc.description.sponsorship | Junta de Andalucia P09-TIC-5386 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | Springer | es |
dc.relation.ispartof | Journal of Electronic Testing, 27 (3), 277-288. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/submittedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Ingeniería Eléctrica | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo | es |
dc.relation.projectID | TEC2007-68072/MIC | es |
dc.relation.projectID | TSI-020400-2008-71/MEDEA+2A105 | es |
dc.relation.projectID | CATRENE CT302 | es |
dc.relation.projectID | P09-TIC-5386 | es |
dc.relation.publisherversion | http://dx.doi.org/10.1007/s10836-010-5193-4 | es |
dc.identifier.doi | 10.1007/s10836-010-5193-4 | es |
idus.format.extent | 28 p. | es |
dc.journaltitle | Journal of Electronic Testing | es |
dc.publication.volumen | 27 | es |
dc.publication.issue | 3 | es |
dc.publication.initialPage | 277 | es |
dc.publication.endPage | 288 | es |
dc.identifier.sisius | 6409113 | es |
dc.contributor.funder | Gobierno de España | |
dc.contributor.funder | Junta de Andalucía | |