Article
Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures
Author/s | Barragán-Villarejo, Manuel
Léger, Gildas Rueda Rueda, Adoración Huertas Díaz, José Luis |
Department | Universidad de Sevilla. Departamento de Ingeniería Eléctrica Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Publication Date | 2011-01-06 |
Deposit Date | 2017-11-22 |
Published in |
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Abstract | This paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the Device Under Test (DUT) to a two-tone input ... This paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the Device Under Test (DUT) to a two-tone input signal. The envelope signal is processed to obtain a digital signature sensitive to key specifications of the DUT. An optimized regression model based on ensemble learning is used to relate the digital signatures to the target specifications. A new Figure of Merit (FOM) is proposed to evaluate the prediction accuracy of the statistical model, and a demonstrator has been developed to prove the feasibility of the approach. This demonstrator features a 2.445 GHz low-power LNA and a simple envelope detector, and has been developed in a 90 nm CMOS technology. Post-layout simulations are provided to verify the functionality of the proposed test technique. |
Funding agencies | Gobierno de España Junta de Andalucía |
Project ID. | TEC2007-68072/MIC
TSI-020400-2008-71/MEDEA+2A105 CATRENE CT302 P09-TIC-5386 |
Citation | Barragán Villarejo, M., Leger Leger, G., Rueda Rueda, A. y Huertas Díaz, J.L. (2011). Alternate test of LNAs through ensemble learning of on-chip digital envelope signatures. Journal of Electronic Testing, 27 (3), 277-288. |
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