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Analysis and Modeling of the Non-Linear Sampling Process in Switched-Current Circuits - Application to Bandpass Sigma-Delta Modulators

 

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Opened Access Analysis and Modeling of the Non-Linear Sampling Process in Switched-Current Circuits - Application to Bandpass Sigma-Delta Modulators
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Author: Rosa Utrera, José Manuel de la
Pérez Verdú, Belén
Medeiro Hidalgo, Fernando
Río Fernández, Rocío del
Rodríguez Vázquez, Ángel Benito
Department: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Date: 2001
Published in: 15th European Conference on Circuit Theory and Design (2001), p I-309-I-312
Document type: Presentation
Abstract: This paper presents a precise model for the transient behaviour of Fully Differential (FD) SwItched-current (SI) memory cells placed at the front-end of high-speed A/D interfaces. This model allows us to analyze the main errors associated to the S/H process, namely: excess transfer-function delay and harmonic distortion. For the latter, the analysis is extended to BandPass Σ∆ Modulators (BP-Σ∆Ms) and a closed-form expression is derived for the third-order intermodulation distortion. Time-domain simulations and experimental measurements taken from a 0.8µm CMOS 4th-order BP-Σ∆M silicon prototype validate our approach.
Cite: Rosa Utrera, J.M.d.l., Pérez Verdú, B., Medeiro Hidalgo, F., Río Fernández, R.d. y Rodríguez Vázquez, Á.B. (2001). Analysis and Modeling of the Non-Linear Sampling Process in Switched-Current Circuits - Application to Bandpass Sigma-Delta Modulators. En 15th European Conference on Circuit Theory and Design, Espoo (Finlandia).
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URI: https://hdl.handle.net/11441/80204

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