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Efficient and accurate statistical analog yield optimization and variation-aware circuit sizing based on computational intelligence techniques

 

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Opened Access Efficient and accurate statistical analog yield optimization and variation-aware circuit sizing based on computational intelligence techniques
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Author: Liu, Bo
Fernández Fernández, Francisco Vidal
Gielen, Georges
Department: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Date: 2011
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 30 (6), 793-805.
Document type: Article
Abstract: In nanometer complementary metal-oxide-semiconductor technologies, worst-case design methods and response-surface-based yield optimization methods face challenges in accuracy. Monte-Carlo (MC) simulation is general and accurate for yield estimation,...
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Cite: Liu, B., Fernández Fernández, F.V. y Gielen, G. (2011). Efficient and accurate statistical analog yield optimization and variation-aware circuit sizing based on computational intelligence techniques. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 30 (6), 793-805.
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Format: PDF

URI: https://hdl.handle.net/11441/76940

DOI: 10.1109/TCAD.2011.2106850

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