Article
Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films
Author/s | Endrino, José Luis
Abad, Manuel D. Gago, Raúl Horwat, D. Jiménez, I. Sánchez López, Juan Carlos |
Publication Date | 2014 |
Deposit Date | 2018-01-08 |
Published in |
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Abstract | In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined ... In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined d.c.-pulsed and r.f.-magnetron sputtering deposition process. The sequence of Fourier transform spectra in the deposited films shows that there is an increase in the number of Ti-C bonds in the films of higher carbon content in parallel with the increment of the total carbon content. In addition, Ti-K EXAFS spectra indicate that in all the deposited TiBC/a-C films, first-shell neighbours are in a nearer structural arrangement than the one expected for a bulk hexagonal TiB2, which could be due to the formation of mixed Ti-B-C compound in a structural unit similar to the one found in h-TiB2. |
Funding agencies | Ministerio de Educación y Ciencia (MEC). España European Union (UE) |
Project ID. | CSD2008-00023
MAT2007-66881-C02-01 NOE EXCELL NMP3- CT-2005-515703 |
Citation | Endrino, J.L., Abad, M.D., Gago, R., Horwat, D., Jiménez, I. y Sánchez López, J.C. (2014). Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films. IOP Conference Series - Materials Science and Enginnering, 12 (1), 012012-. |
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