dc.creator | Endrino, José Luis | es |
dc.creator | Abad, Manuel D. | es |
dc.creator | Gago, Raúl | es |
dc.creator | Horwat, D. | es |
dc.creator | Jiménez, I. | es |
dc.creator | Sánchez López, Juan Carlos | es |
dc.date.accessioned | 2018-01-08T15:29:04Z | |
dc.date.available | 2018-01-08T15:29:04Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Endrino, J.L., Abad, M.D., Gago, R., Horwat, D., Jiménez, I. y Sánchez López, J.C. (2014). Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films. IOP Conference Series - Materials Science and Enginnering, 12 (1), 012012-. | |
dc.identifier.issn | 1757-8981 (impreso) | es |
dc.identifier.issn | 1757-899X (electrónico) | es |
dc.identifier.uri | http://hdl.handle.net/11441/68395 | |
dc.description.abstract | In this study, we have successfully used the extended X-ray absorption fine structure (EXAFS) technique at the Ti-K edge to extract the local structure in a set of nanocomposite TiBC/a-C coatings deposited by a combined d.c.-pulsed and r.f.-magnetron sputtering deposition process. The sequence of Fourier transform spectra in the deposited films shows that there is an increase in the number of Ti-C bonds in the films of higher carbon content in parallel with the increment of the total carbon content. In addition, Ti-K EXAFS spectra indicate that in all the deposited TiBC/a-C films, first-shell neighbours are in a nearer structural arrangement than the one expected for a bulk hexagonal TiB2, which could be due to the formation of mixed Ti-B-C compound in a structural unit similar to the one found in h-TiB2. | es |
dc.description.sponsorship | Ministerio de Educación y Ciencia CSD2008-00023, MAT2007-66881-C02-01 | es |
dc.description.sponsorship | European Union NOE EXCELL NMP3- CT-2005-515703 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | Institute of Physics Publishing | es |
dc.relation.ispartof | IOP Conference Series - Materials Science and Enginnering, 12 (1), 012012-. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | Extended X-ray absorption fine structure (EXAFS) investigations of Ti bonding environment in sputter-deposited nanocomposite TiBC/a-C thin films | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/publishedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.relation.projectID | CSD2008-00023 | es |
dc.relation.projectID | MAT2007-66881-C02-01 | es |
dc.relation.projectID | NOE EXCELL NMP3- CT-2005-515703 | es |
dc.relation.publisherversion | http://dx.doi.org/10.1088/1757-899X/12/1/012012 | es |
dc.identifier.doi | 10.1088/1757-899X/12/1/012012 | es |
idus.format.extent | 4 p. | es |
dc.journaltitle | IOP Conference Series - Materials Science and Enginnering | es |
dc.publication.volumen | 12 | es |
dc.publication.issue | 1 | es |
dc.publication.initialPage | 012012 | es |
dc.contributor.funder | Ministerio de Educación y Ciencia (MEC). España | |
dc.contributor.funder | European Union (UE) | |