AUTODDM: AUTOmatic characterization tool for the Delay Degradation Model

Abstract

As delay models used in logic timing simulation become more and more complex, the problem of model parameter values extraction arise as an important issue, which is necessary to face in order to achieve a practical implementation of the model. In this way, this communication describes the characterization process associated to the previously developed Delay Degradation Model for CMOS logic gates (DDM) and the implementation of an automatic characterization tool that automates the process and allows an easy and fast model parameters extraction.