Browsing Ponencias (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) by Subject "Design for Testability"
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Presentation
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
(Institute of Electrical and Electronics Engineers, 2004)In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal ...