Listar Ponencias (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) por materia 

ListarPonencias (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) por materia "Design for Testability"

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      An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators 

      Escalera Morón, Sara; García González, José Manuel; Guerra Vinuesa, Oscar; Rosa Utrera, José Manuel de la; Medeiro Hidalgo, Fernando; Pérez Verdú, Belén; Rodríguez Vázquez, Ángel Benito (Institute of Electrical and Electronics Engineers, 2004)
      In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal ...