dc.creator | Linares Barranco, Bernabé | es |
dc.creator | Serrano Gotarredona, María Teresa | es |
dc.date.accessioned | 2020-09-30T10:33:02Z | |
dc.date.available | 2020-09-30T10:33:02Z | |
dc.date.issued | 2007 | |
dc.identifier.citation | Linares Barranco, B. y Serrano Gotarredona, M.T. (2007). A Physical Interpretation of the Distance Term in Pelgrom’s Mismatch Model results in very Efficient CAD. En ISCAS 2007: IEEE International Symposium on Circuits and Systems (1561-1564), New Orleans, LO, USA: IEEE Computer Society. | |
dc.identifier.isbn | 1-4244-0920-9 | es |
dc.identifier.issn | 0271-4302 | es |
dc.identifier.uri | https://hdl.handle.net/11441/101607 | |
dc.description.abstract | In 1989 Pelgrom et al. published a mismatch
model for MOS transistors, where the standard
quadratic deviation of the mismatch in a parameter
between two identical transistors, is given by two
independent terms: (1) a transistor size-dependent
term and (2) an inter-transistor distance-dependent
term. To include the distance term, some researchers
have developed CAD tools based on the so called
σ-Space Methodology, which result in very
computationally expensive algorithms. Such
algorithms become non-viable even for circuits with a
reduced number of transistors. On the other hand, by
understanding and interpreting correctly the physical
origin of Pelgrom’s model distance term, one can
implement in a straight forward manner this
mismatch contribution in a CAD tool. Furthermore,
the computational cost results negligible and viable
for any number of transistors. | es |
dc.format | application/pdf | es |
dc.format.extent | 4 | es |
dc.language.iso | eng | es |
dc.publisher | IEEE Computer Society | es |
dc.relation.ispartof | ISCAS 2007: IEEE International Symposium on Circuits and Systems (2007), p 1561-1564 | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | A Physical Interpretation of the Distance Term in Pelgrom’s Mismatch Model results in very Efficient CAD | es |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/submittedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Arquitectura y Tecnología de Computadores | es |
dc.relation.publisherversion | https://ieeexplore.ieee.org/document/4252950 | es |
dc.identifier.doi | 10.1109/ISCAS.2007.378710 | es |
dc.publication.initialPage | 1561 | es |
dc.publication.endPage | 1564 | es |
dc.eventtitle | ISCAS 2007: IEEE International Symposium on Circuits and Systems | es |
dc.eventinstitution | New Orleans, LO, USA | es |
dc.relation.publicationplace | New York, USA | es |