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dc.creatorLéger, Gildases
dc.date.accessioned2018-05-14T16:31:24Z
dc.date.available2018-05-14T16:31:24Z
dc.date.issued2015
dc.identifier.citationLéger, G. (2015). Boundary cost optimization for Alternate Test. En IEEE European Test Symposium (ETS) (1-6), Cluj-Napoca (Rumania): Institute of Electrical and Electronics Engineers.
dc.identifier.urihttps://hdl.handle.net/11441/74585
dc.description.abstractAlternate Test has demonstrated in the last decade that advanced machine-learning tools can leverage the accuracy gap between functional test and indirect, or model-based, test. If a regression approach is taken, a model should be trained for each specification. The advantage is that the results are interpreted just like performance measurements but the drawback is that accuracy is required over the full variation range. On the other hand, a classification approach can be seen as a wiser solution since it locates the pass/fail boundary, which inherently contains all the specification information, in the cheap measurement space. Cost optimization due to imbalance between test escape and yield loss is usually handled by guard-banding on specifications. This is straightforward to translate to regression-based Alternate Test but not for classification-based. This paper shows that two different asymmetric approaches consistently outperforms an off-the-shelf symmetric algorithm. The first technique is based on manipulating the decision threshold while the second technique directly builds an optimized pass-fail boundary by considering different costs to penalize test escapes and yield losses.es
dc.description.sponsorshipMinisterio de Economia y Competitividad TEC2011-28302es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherInstitute of Electrical and Electronics Engineerses
dc.relation.ispartofIEEE European Test Symposium (ETS) (2015), p 1-6
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 Estados Unidos de América*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleBoundary cost optimization for Alternate Testes
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.relation.projectIDTEC2011-28302es
dc.relation.publisherversionhttp://dx.doi.org/10.1109/ETS.2015.7138755es
dc.identifier.doi10.1109/ETS.2015.7138755es
idus.format.extent6 p.es
dc.publication.initialPage1es
dc.publication.endPage6es
dc.eventtitleIEEE European Test Symposium (ETS)es
dc.eventinstitutionCluj-Napoca (Rumania)es
dc.contributor.funderMinisterio de Economía y Competitividad (MINECO). España

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