Repositorio de producción científica de la Universidad de Sevilla

Compensation of PVT Variations in ToF Imagers with In-Pixel TDC

Opened Access Compensation of PVT Variations in ToF Imagers with In-Pixel TDC

Citas

buscar en

Estadísticas
Icon
Exportar a
Autor: Rodríguez Vázquez, Ángel Benito
Vornicu, Ion
Carmona Galán, Ricardo
Departamento: Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo
Fecha: 2017
Publicado en: Sensors, 17 (1072), 1-18.
Tipo de documento: Artículo
Resumen: The design of a direct time-of-flight complementary metal-oxide-semiconductor (CMOS) image sensor (dToF-CIS) based on a single-photon avalanche-diode (SPAD) array with an in-pixel time-to-digital converter (TDC) must contemplate system-level aspects that affect its overall performance. This paper provides a detailed analysis of the impact of process parameters, voltage supply, and temperature (PVT) variations on the time bin of the TDC array. Moreover, the design and characterization of a global compensation loop is presented. It is based on a phase locked loop (PLL) that is integrated on-chip. The main building block of the PLL is a voltage-controlled ring-oscillator (VCRO) that is identical to the ones employed for the in-pixel TDCs. The reference voltage that drives the master VCRO is distributed to the voltage control inputs of the slave VCROs such that their multiphase outputs become invariant to PVT changes. These outputs act as time interpolators for the TDCs. Therefore the com...
[Ver más]
Cita: Rodríguez Vázquez, Á.B., Vornicu, I. y Carmona Galán, R. (2017). Compensation of PVT Variations in ToF Imagers with In-Pixel TDC. Sensors, 17 (1072), 1-18.
Tamaño: 3.632Mb
Formato: PDF

URI: http://hdl.handle.net/11441/64032

DOI: 10.3390/s17051072

Ver versión del editor

Mostrar el registro completo del ítem


Esta obra está bajo una Licencia Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internacional

Este registro aparece en las siguientes colecciones