ListarArtículos (Electrónica y Electromagnetismo) por materia "Bias temperature instability"
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Artículo
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
(Elsevier B.V., 2020-05)In the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, ...