2-D analysis of leakage in printed-circuit lines using discrete complex-images technique

Bernal Méndez, Joaquín; Mesa Ledesma, Francisco Luis; Medina Mena, Francisco

doi:10.1109/TMTT.2002.801320

Artículo

dc.creator	Bernal Méndez, Joaquín	es
dc.creator	Mesa Ledesma, Francisco Luis	es
dc.creator	Medina Mena, Francisco	es
dc.date.accessioned	2020-07-07T14:23:46Z
dc.date.available	2020-07-07T14:23:46Z
dc.date.issued	2002
dc.identifier.citation	Bernal Méndez, J., Mesa Ledesma, F.L. y Medina Mena, F. (2002). 2-D analysis of leakage in printed-circuit lines using discrete complex-images technique. IEEE Transactions on Microwave Theory and Techniques, 50 (8), 1895-1900.
dc.identifier.issn	0018-9480	es
dc.identifier.issn	1557-9670	es
dc.identifier.uri	https://hdl.handle.net/11441/98950
dc.description.abstract	The mixed-potential integral equation is combined with the discrete complex-images technique to analyze the complete spectrum of multilayered printed transmission lines. A relevant contribution of the present two-dimensional approach is its ability to study both the bound and leaky regimes in a very simple, systematic, and efficient way. Since, the analysis is carried out in the spatial domain, this method makes it possible to analyze the leakage phenomenon for structures with nonzero-thickness conductors. Efficient quasi-analytical techniques are employed to solve the integral equation.	es
dc.format	application/pdf	es
dc.format.extent	6 p.	es
dc.language.iso	eng	es
dc.publisher	Institute of Electrical and Electronics Engineers	es
dc.relation.ispartof	IEEE Transactions on Microwave Theory and Techniques, 50 (8), 1895-1900.
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internacional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.subject	Complex images	es
dc.subject	Leaky modes	es
dc.subject	Mixed-potential integral equation	es
dc.subject	Printed-circuit lines	es
dc.title	2-D analysis of leakage in printed-circuit lines using discrete complex-images technique	es
dc.type	info:eu-repo/semantics/article	es
dc.type.version	info:eu-repo/semantics/acceptedVersion	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Física Aplicada I	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Física Aplicada III	es
dc.relation.projectID	TIC98- 0630	es
dc.relation.publisherversion	https://doi.org/10.1109/TMTT.2002.801320	es
dc.identifier.doi	10.1109/TMTT.2002.801320	es
dc.journaltitle	IEEE Transactions on Microwave Theory and Techniques	es
dc.publication.volumen	50	es
dc.publication.issue	8	es
dc.publication.initialPage	1895	es
dc.publication.endPage	1900	es
dc.identifier.sisius	6702422	es
dc.contributor.funder	Comisión Interministerial de Ciencia y Tecnología (CICYT). España TIC98- 0630	es

Ficheros	Tamaño	Formato	Ver	Descripción
2-D Analysis of Leakage in ...	282.6Kb	[PDF]	Ver/Abrir

Este registro aparece en las siguientes colecciones

Artículos (Electrónica y Electromagnetismo)

Mostrar el registro sencillo del ítem

Excepto si se señala otra cosa, la licencia del ítem se describe como: Attribution-NonCommercial-NoDerivatives 4.0 Internacional