dc.creator | Rodríguez Macías, Rafael | es |
dc.creator | Fernández Fernández, Francisco Vidal | es |
dc.creator | Rodríguez Vázquez, Ángel Benito | es |
dc.creator | Huertas Díaz, José Luis | es |
dc.date.accessioned | 2020-03-09T15:47:48Z | |
dc.date.available | 2020-03-09T15:47:48Z | |
dc.date.issued | 1995 | |
dc.identifier.citation | Rodríguez Macías, R., Fernández Fernández, F.V., Rodríguez Vázquez, Á.B. y Huertas Díaz, J.L. (1995). Tool for fast mismatch analysis of analog circuits. En IEEE International Symposium on Circuits and Systems (2148-2151), Seattle, USA: Institute of Electrical and Electronics Engineers. | |
dc.identifier.issn | 0271-4310 | es |
dc.identifier.uri | https://hdl.handle.net/11441/94048 | |
dc.description.abstract | A tool is presented that evaluates statistical deviations in performance characteristics of analog circuits, starting from statistical deviations in the technological parameters of MOS transistors. Performance is demonstrated via the analysis of a Miller OTA in two different configurations and a linearized CMOS transconductor. The CPU time is reduced by a factor of 25 to 90 with respect to conventional Monte Carlo simulation, while maintaining similar accuracy in the computations. | es |
dc.format | application/pdf | es |
dc.format.extent | 4 p. | es |
dc.language.iso | eng | es |
dc.publisher | Institute of Electrical and Electronics Engineers | es |
dc.relation.ispartof | IEEE International Symposium on Circuits and Systems (1995), p 2148-2151 | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.title | Tool for fast mismatch analysis of analog circuits | es |
dc.type | info:eu-repo/semantics/conferenceObject | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/acceptedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo | es |
dc.relation.publisherversion | https://doi.org/10.1109/ISCAS.1995.523851 | es |
dc.identifier.doi | 10.1109/ISCAS.1995.523851 | es |
dc.publication.initialPage | 2148 | es |
dc.publication.endPage | 2151 | es |
dc.eventtitle | IEEE International Symposium on Circuits and Systems | es |
dc.eventinstitution | Seattle, USA | es |