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dc.creatorRodríguez Macías, Rafaeles
dc.creatorFernández Fernández, Francisco Vidales
dc.creatorRodríguez Vázquez, Ángel Benitoes
dc.creatorHuertas Díaz, José Luises
dc.date.accessioned2020-03-09T15:47:48Z
dc.date.available2020-03-09T15:47:48Z
dc.date.issued1995
dc.identifier.citationRodríguez Macías, R., Fernández Fernández, F.V., Rodríguez Vázquez, Á.B. y Huertas Díaz, J.L. (1995). Tool for fast mismatch analysis of analog circuits. En IEEE International Symposium on Circuits and Systems (2148-2151), Seattle, USA: Institute of Electrical and Electronics Engineers.
dc.identifier.issn0271-4310es
dc.identifier.urihttps://hdl.handle.net/11441/94048
dc.description.abstractA tool is presented that evaluates statistical deviations in performance characteristics of analog circuits, starting from statistical deviations in the technological parameters of MOS transistors. Performance is demonstrated via the analysis of a Miller OTA in two different configurations and a linearized CMOS transconductor. The CPU time is reduced by a factor of 25 to 90 with respect to conventional Monte Carlo simulation, while maintaining similar accuracy in the computations.es
dc.formatapplication/pdfes
dc.format.extent4 p.es
dc.language.isoenges
dc.publisherInstitute of Electrical and Electronics Engineerses
dc.relation.ispartofIEEE International Symposium on Circuits and Systems (1995), p 2148-2151
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleTool for fast mismatch analysis of analog circuitses
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.publisherversionhttps://doi.org/10.1109/ISCAS.1995.523851es
dc.identifier.doi10.1109/ISCAS.1995.523851es
dc.publication.initialPage2148es
dc.publication.endPage2151es
dc.eventtitleIEEE International Symposium on Circuits and Systemses
dc.eventinstitutionSeattle, USAes

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