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dc.creatorMedeiro Hidalgo, Fernandoes
dc.creatorRío Fernández, Rocío deles
dc.creatorRosa Utrera, José Manuel de laes
dc.creatorPérez Verdú, Belénes
dc.creatorRodríguez Vázquez, Ángel Benitoes
dc.date.accessioned2019-10-24T14:06:17Z
dc.date.available2019-10-24T14:06:17Z
dc.date.issued2003
dc.identifier.citationMedeiro Hidalgo, F., Río Fernández, R.d., Rosa Utrera, J.M.d.l., Pérez Verdú, B. y Rodríguez Vázquez, Á.B. (2003). Expandible high-order cascade ya modulator with constant, reduced systematic loss of resolution. En Proceedings of the 20th IEEE Instrumentation Technology Conference (229-231), Vail, USA: Institute of Electrical and Electronics Engineers.
dc.identifier.isbn0-7803-7705-2es
dc.identifier.issn1091-5281es
dc.identifier.urihttps://hdl.handle.net/11441/89876
dc.description.abstractAn arbitrary order sigma-delta modulator cascude architecture is presented with only I-bit loss of resolution due to scaling issues, even with single-bit quantizulion. This loss is kept with a high overloading point, regardless of the order. Simulations reveol that circuit imperfections can be tolerated up to 6th order, so that 90-dB SNDR can be obtained with x16 oversampling, without multi-bit quantization.es
dc.description.sponsorshipEuropean Commission 2001-34283/TAMES-2es
dc.description.sponsorshipMinisterio de Ciencia y Tecnología TIC2001-0929/ADAVEREes
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherInstitute of Electrical and Electronics Engineerses
dc.relation.ispartofProceedings of the 20th IEEE Instrumentation Technology Conference (2003), p 229-231
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleExpandible high-order cascade ya modulator with constant, reduced systematic loss of resolutiones
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.projectID2001-34283/TAMES-2es
dc.relation.projectIDTIC2001-0929/ADAVEREes
dc.relation.publisherversionhttps://doi.org/10.1109/IMTC.2003.1208157es
dc.identifier.doi10.1109/IMTC.2003.1208157es
idus.format.extent3 p.es
dc.publication.initialPage229es
dc.publication.endPage231es
dc.eventtitleProceedings of the 20th IEEE Instrumentation Technology Conferencees
dc.eventinstitutionVail, USAes
dc.identifier.sisius5568637es

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