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A BIST solution for frequency domain characterization of analog circuits

dc.creatorBarragán Asián, Manuel Josées
dc.creatorVázquez García de la Vega, Diegoes
dc.creatorRueda Rueda, Adoraciónes
dc.date.accessioned2018-03-27T13:52:15Z
dc.date.available2018-03-27T13:52:15Z
dc.date.issued2010
dc.identifier.citationBarragán Asián, M.J., Vázquez García de la Vega, D. y Rueda Rueda, A. (2010). A BIST solution for frequency domain characterization of analog circuits. Journal of Electronic Testing, 26 (4), 429-441.
dc.identifier.issn0923-8174 (impreso)es
dc.identifier.issn1573-0727 (electrónico)es
dc.identifier.urihttps://hdl.handle.net/11441/71350
dc.description.abstractThis work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated.es
dc.description.sponsorshipGobierno de España TEC2007-68072/MIC, TSI 020400- 2008-71es
dc.description.sponsorshipCatrene European Project 2A105SR2es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherSpringeres
dc.relation.ispartofJournal of Electronic Testing, 26 (4), 429-441.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectAnalog BISTes
dc.subjectSignal Generatores
dc.subjectFrequency Response Characterizationes
dc.subjectOn-Chip Spectrum Analyzeres
dc.subjectOn-Chip Network Analyzeres
dc.titleA BIST solution for frequency domain characterization of analog circuitses
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/submittedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.projectIDTEC2007-68072/MICes
dc.relation.projectIDTSI 020400- 2008-71es
dc.relation.projectID2A105SR2es
dc.relation.publisherversionhttp://dx.doi.org/10.1007/s10836-010-5158-7es
dc.identifier.doi10.1007/s10836-010-5158-7es
idus.format.extent25 p.es
dc.journaltitleJournal of Electronic Testinges
dc.publication.volumen26es
dc.publication.issue4es
dc.publication.initialPage429es
dc.publication.endPage441es
dc.contributor.funderGobierno de España

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