Article
A BIST solution for frequency domain characterization of analog circuits
Author/s | Barragán Asián, Manuel José
Vázquez García de la Vega, Diego Rueda Rueda, Adoración |
Department | Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo |
Publication Date | 2010 |
Deposit Date | 2018-03-27 |
Published in |
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Abstract | This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion ... This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on 1storder ÓÄ modulation and very simple digital processing. The signal generator and the response analyzer have been implemented using the Switched-Capacitor (SC) technique in a standard 0.35ìm-3.3V CMOS technology. Both circuits have been separately validated, and an on-board prototype of the complete test system for frequency characterization has been implemented. Experimental results verify the functionality of the proposed approach, and a dynamic range of 70dB@62.5kHz (1MHz clock) has been demonstrated. |
Funding agencies | Gobierno de España |
Project ID. | TEC2007-68072/MIC
TSI 020400- 2008-71 2A105SR2 |
Citation | Barragán Asián, M.J., Vázquez García de la Vega, D. y Rueda Rueda, A. (2010). A BIST solution for frequency domain characterization of analog circuits. Journal of Electronic Testing, 26 (4), 429-441. |
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A BIST Solution for Frequency.pdf | 1.693Mb | [PDF] | View/ | |