Presentation
STEM tomography and CBED polarity analysis of crystallographic pores in InP
Author/s | Beltrán, Ana M.
Winter, B. Spiecker, Erdmann |
Department | Universidad de Sevilla. Departamento de Ingeniería y Ciencia de los Materiales y del Transporte |
Publication Date | 2013 |
Deposit Date | 2018-01-24 |
Published in |
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Citation | Beltrán, A.M., Winter, B. y Spiecker, E. (2013). STEM tomography and CBED polarity analysis of crystallographic pores in InP. En Microscopy Conference (412-413), Regensburg (Germany): EPrints 3. |
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beltran_ponencia_2013_STEM.pdf | 137.9Kb | [PDF] | View/ | |