Article
Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N2+ bombardment
| Author/s | Barranco Quero, Ángel
Holgado Vázquez, Juan Pedro Yubero Valencia, Francisco Espinós Manzorro, Juan Pedro Martín, Ana I. Rodríguez González-Elipe, Agustín |
| Department | Universidad de Sevilla. Departamento de Química Inorgánica |
| Publication Date | 2001-05 |
| Deposit Date | 2017-08-01 |
| Published in |
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| Abstract | N2+ bombardment of Al2O3 has been investigated by near edge x-ray absorption fine structure spectroscopy. Two kinds of species were detected and were attributed to implanted nitrogen atoms and nitride species. These results ... |
| Funding agencies | Comisión Interministerial de Ciencia y Tecnología (CICYT). España |
| Project ID. | MAT97-0689
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| Citation | Barranco Quero, Á., Holgado Vázquez, J.P., Yubero Valencia, F., Espinós, J.P., Martín, A.I. y Rodríguez González-Elipe, A. (2001). Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N2+ bombardment. Journal of Vacuum Science and Technology A, 19 (3), 1024-1026. |
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| Near edge x-ray.pdf | 36.45Kb | 
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http://hdl.handle.net/11441/63460
https://doi.org/10.1116/1.1355762This item appears in the following collection(s)
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