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dc.creatorQuintana Toledo, José Maríaes
dc.creatorAvedillo de Juan, María Josées
dc.creatorNúñez Martínez, Juanes
dc.creatorPettenghi Roldán, Héctores
dc.date.accessioned2024-01-10T12:03:02Z
dc.date.available2024-01-10T12:03:02Z
dc.date.issued2009-02
dc.identifier.citationQuintana Toledo, J.M., Avedillo de Juan, M.J., Núñez Martínez, J. y Pettenghi Roldán, H. (2009). Operation limits for RTD-based MOBILE circuits. IEEE Transactions on Circuits and Systems I: Regular Papers. https://doi.org/10.1109/TCSI.2008.925943.
dc.identifier.issn1549-8328es
dc.identifier.issn1558-0806es
dc.identifier.urihttps://hdl.handle.net/11441/153159
dc.description.abstractResonant-tunneling-diode (RTD)-based monostable-bistable logic element (MOBILE) circuits operate properly in a certain frequency range. They exhibit both a minimum operating frequency and a maximum one. From a design point of view, it should be desirable to have gates with a correct operation from dc up to the maximum operating frequency (i.e., without the minimum bound). This paper undertakes this problem by analyzing how transistors and RTDs interact in RTD-based circuits. Two malfunctions have been identified: the incorrect evaluation of inputs and the lack of self-latching operation. The difficulty to study these problems in an analytical way has been overcome by resorting to series expansions for both the RTD and the heterojunction field-effect transistor I- V characteristics in the points of interest. We have obtained analytical expression linking representative device parameters and technological setup, for a MOBILE-based circuit to operate correctly.es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherIEEEes
dc.relation.ispartofIEEE Transactions on Circuits and Systems I: Regular Papers.
dc.subjectResonant Tunneling Diodes (RTDs)es
dc.subjectMOBILE circuitses
dc.subjectLinear Threshold Gateses
dc.subjectNanoelectronicses
dc.titleOperation limits for RTD-based MOBILE circuitses
dc.typeinfo:eu-repo/semantics/articlees
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.publisherversionhttps://dx.doi.org/10.1109/TCSI.2008.925943es
dc.identifier.doi10.1109/TCSI.2008.925943es
dc.journaltitleIEEE Transactions on Circuits and Systems I: Regular Paperses

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