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dc.creatorEl-Sayed, Sarah A.es
dc.creatorCamuñas Mesa, Luis Alejandroes
dc.creatorLinares Barranco, Bernabées
dc.creatorStratigopoulos, Haralampos G.es
dc.date.accessioned2023-01-31T16:57:26Z
dc.date.available2023-01-31T16:57:26Z
dc.date.issued2019
dc.identifier.citationEl-Sayed, S.A., Camuñas Mesa, L.A., Linares Barranco, B. y Stratigopoulos, H.G. (2019). Self-Testing Analog Spiking Neuron Circuit. En 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (81-84), Lausanne, Suiza: Institute of Electrical and Electronics Engineers.
dc.identifier.isbn978-172811201-5es
dc.identifier.urihttps://hdl.handle.net/11441/142243
dc.description.abstractHardware-implemented neural networks are foreseen to play an increasing role in numerous applications. In this paper, we address the problem of post-manufacturing test and self-test of hardware-implemented neural networks. In particular, we propose a self-testable version of a spiking neuron circuit. The self-test wrapper is a compact circuit composed of a low-precision ramp generator and a small digital block. The self-test principle is demonstrated on a spiking neuron circuit design in 0.35μm CMOS technology.es
dc.formatapplication/pdfes
dc.format.extent4 p.es
dc.language.isoenges
dc.publisherInstitute of Electrical and Electronics Engineerses
dc.relation.ispartof2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (2019), pp. 81-84.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleSelf-Testing Analog Spiking Neuron Circuites
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.publisherversionhttps://doi.org/10.1109/SMACD.2019.8795234es
dc.identifier.doi10.1109/SMACD.2019.8795234es
dc.publication.initialPage81es
dc.publication.endPage84es
dc.eventtitle2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)es
dc.eventinstitutionLausanne, Suizaes

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