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dc.creatorSpyrou, Theofiloses
dc.creatorEl-Sayed, Sarah A.es
dc.creatorAfacan, Engines
dc.creatorCamuñas Mesa, Luis Alejandroes
dc.creatorLinares Barranco, Bernabées
dc.creatorStratigopoulos, Haralampos G.es
dc.date.accessioned2023-01-19T10:36:08Z
dc.date.available2023-01-19T10:36:08Z
dc.date.issued2021
dc.identifier.citationSpyrou, T., El-Sayed, S.A., Afacan, E., Camuñas Mesa, L.A., Linares Barranco, B. y Stratigopoulos, H.G. (2021). Neuron fault tolerance in spiking neural networks. En 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (743-748), Grenoble, France: Institute of Electrical and Electronics Engineers. IEEE.
dc.identifier.issn1530-1591es
dc.identifier.urihttps://hdl.handle.net/11441/141573
dc.description.abstractThe error-resiliency of Artificial Intelligence (AI) hardware accelerators is a major concern, especially when they are deployed in mission-critical and safety-critical applications. In this paper, we propose a neuron fault tolerance strategy for Spiking Neural Networks (SNNs). It is optimized for low area and power overhead by leveraging observations made from a largescale fault injection experiment that pinpoints the critical fault types and locations. We describe the fault modeling approach, the fault injection framework, the results of the fault injection experiment, the fault-tolerance strategy, and the fault-tolerant SNN architecture. The idea is demonstrated on two SNNs that we designed for two SNN-oriented datasets, namely the N-MNIST and IBM’s DVS128 gesture datasets.es
dc.description.sponsorshipJunta de Andalucía-US-1260118es
dc.description.sponsorshipUniversidad de Sevilla-VI PPITes
dc.formatapplication/pdfes
dc.format.extent6 p.es
dc.language.isoenges
dc.publisherInstitute of Electrical and Electronics Engineers. IEEEes
dc.relation.ispartof2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) (2021), pp. 743-748.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.titleNeuron fault tolerance in spiking neural networkses
dc.typeinfo:eu-repo/semantics/conferenceObjectes
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.projectIDUS-1260118es
dc.relation.projectIDVI PPIT USEes
dc.relation.publisherversionhttps://dx.doi.org/10.23919/DATE51398.2021.9474081es
dc.identifier.doi10.23919/DATE51398.2021.9474081es
dc.journaltitleDesign, Automation & Test in Europe Conference & Exhibition (DATE)es
dc.publication.issue9474081es
dc.publication.initialPage743es
dc.publication.endPage748es
dc.eventtitle2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
dc.eventinstitutionGrenoble, France
dc.contributor.funderJunta de Andalucíaes
dc.contributor.funderUniversidad de Sevillaes

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