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dc.creatorDelgado Lozano, Ignacio Maríaes
dc.creatorTena Sánchez, Ericaes
dc.creatorNúñez Martínez, Juanes
dc.creatorAcosta Jiménez, Antonio Josées
dc.date.accessioned2021-11-03T10:12:14Z
dc.date.available2021-11-03T10:12:14Z
dc.date.issued2021
dc.identifier.citationDelgado Lozano, I.M., Tena Sánchez, E., Núñez Martínez, J. y Acosta Jiménez, A.J. (2021). Gate-Level Design Methodology for Side-Channel Resistant Logic Styles Using TFETs. IEEE Embedded Systems Letters
dc.identifier.issn1943-0671es
dc.identifier.urihttps://hdl.handle.net/11441/127021
dc.description.abstractThe design of secure circuits in emerging technologies is an appealing area that requires new efforts and attention as an effective solution to secure applications with power constraints. The paper deals with the optimized design of DPA-resilient hiding-based techniques, using Tunnel Field-Effect Transistors (TFETs). Specifically, proposed TFET implementations of Dual-Precharge-Logic primitives optimizing their computation tree in three different ways, are applied to the design of PRIDE Sbox-4, the most vulnerable block of the PRIDE lightweight cipher. The performance of simulation-based DPA attacks on the proposals have shown spectacular results in security gain (34 out of 48 attacks fail for optimized computation trees in TFET technology) and power reduction (x25), compared to their CMOS-based counterparts in 65nm, which is a significant advance in the development of secure circuits with TFETs.es
dc.description.sponsorshipMinisterio de Economía y Competitividad TEC2017-87052-Pes
dc.description.sponsorshipMinisterio de Economía y Competitividad PID2020-116664RB-I00es
dc.description.sponsorshipJunta de Andalucía Projectos US-1380876 y US-1380823es
dc.description.sponsorshipEuropean Union’s Horizon 2020 Grant Agreement No. 95262 and No. 804476es
dc.formatapplication/pdfes
dc.format.extent4 p.es
dc.language.isoenges
dc.publisherIEEEes
dc.relation.ispartofIEEE Embedded Systems Letters
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectVLSI design of cryptographic circuitses
dc.subjectside-channel attacks (SCAs)es
dc.subjectinformation securityes
dc.subjectlow-poweres
dc.subjectdual precharge logic (DPL)es
dc.subjectsubstitution box (Sbox)es
dc.subjectsense amplifier based logic (SABL)es
dc.subjectemerging technologieses
dc.subjectTFETes
dc.titleGate-Level Design Methodology for Side-Channel Resistant Logic Styles Using TFETses
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Tecnología Electrónicaes
dc.relation.projectIDTEC2017-87052-Pes
dc.relation.projectIDPID2020-116664RB-I00es
dc.relation.projectIDUS-1380876es
dc.relation.projectIDUS-1380823es
dc.relation.projectIDGrant Agreement No. 95262es
dc.relation.projectIDGrant Agreement No. 804476es
dc.relation.publisherversionhttp://dx.doi.org/10.1109/LES.2021.3122395es
dc.identifier.doi10.1109/LES.2021.3122395es
dc.journaltitleIEEE Embedded Systems Letterses
dc.contributor.funderMinisterio de Economía y Competitividad (MINECO). Españaes
dc.contributor.funderJunta de Andalucíaes
dc.contributor.funderEuropean Union (UE). H2020es

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