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Artículo
A Rad-hard On-chip CMOS Charge Detector with High Dynamic Range
(Institute of Electrical and Electronics Engineers, 2023)
This article introduces a CMOS charge detector tailored for measuring ionizing radiation in a wide range of fluences. It represents an entirely on-chip solution based on capacitive sensing. It was fabricated using a standard ...
Artículo
TEMAS: A Flexible Non-AI Algorithm for Metrology of Single-Core and Core-Shell Nanoparticles from TEM Images
(Wiley-Blackwell, 2023)
An essential application of electron microscopy is to provide feedback to tune the fabrication of nanoparticles (NPs). Real samples tend to follow a size distribution commonly linked to the synthesis process used and in ...