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A Procedure for Alternate Test Feature Design and Selection

Opened Access A Procedure for Alternate Test Feature Design and Selection

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Autor: Barragán Asián, Manuel José
Léger, Gildas
Fecha: 2015
Publicado en: IEEE Design and Test, 32 (1), 18-25.
Tipo de documento: Artículo
Resumen: This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
Cita: Barragán Asián, M.J. y Leger Leger, G. (2015). A Procedure for Alternate Test Feature Design and Selection. IEEE Design and Test, 32 (1), 18-25.
Tamaño: 507.7Kb
Formato: PDF

URI: https://hdl.handle.net/11441/74372

DOI: 10.1109/MDAT.2014.2361722

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