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MS-3-P-5702 Nanoanalytical investigations at the interface of 4H-SiC/SiO2 MOSFETs [Póster]

 

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Opened Access MS-3-P-5702 Nanoanalytical investigations at the interface of 4H-SiC/SiO2 MOSFETs [Póster]
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Author: Tan, H.
Beltrán, A.M.
March, K.
Mortet, Vincent
Bedel-Pereira, Eléna
Cristiano, Fuccio
Strenger, C.
Bauer, A.J.
Schamm-Chardon, Sylvie
Department: Universidad de Sevilla. Departamento de Ingeniería y Ciencia de los Materiales y del Transporte
Date: 2014
ISBN/ISSN: 978-80-260-6720-7
Document type: Presentation
Cite: Tan, H., Beltrán, A.M., March, K., Mortet, V., Bedel-Pereira, E., Cristiano, F.,...,Schamm-Chardon, S. (2014). MS-3-P-5702 Nanoanalytical investigations at the interface of 4H-SiC/SiO2 MOSFETs [Póster]. En 18th International Microscopy Congress (1-3), Prague (Czech Republic): Czechoslovak Microscopy Society.
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Format: PDF

URI: https://hdl.handle.net/11441/70540

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