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Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

 

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Opened Access Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor
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Author: Gontard, Lionel C.
Moldovan, Grigore
Carmona Galán, Ricardo
Lin, Chao
Kirkland, Angus I.
Date: 2014
Published in: Microscopy, 63 (2), 119-130.
Document type: Article
Abstract: There is great interest in developing novel position-sensitive direct detectors for transmission electron microscopy (TEM) that do not rely in the conversion of electrons into photons. Direct imaging improves contrast and efficiency and allows the o...
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Cite: Gontard, L.C., Moldovan, G., Carmona Galán, R., Lin, C. y Kirkland, A.I. (2014). Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor. Microscopy, 63 (2), 119-130.
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Format: PDF

URI: https://hdl.handle.net/11441/69935

DOI: 10.1093/jmicro/dft051

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