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Development of ReflEXAFS data analysis for deeper surface structure studies

 

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Opened Access Development of ReflEXAFS data analysis for deeper surface structure studies
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Author: López Flores, Víctor
Ansell, Stuart
Ramos, Silvia
Bowron, Daniel T.
Díaz Moreno, Sofía
Muñoz Páez, Adela
Department: Universidad de Sevilla. Departamento de Química Inorgánica
Date: 2009
Published in: Journal of Physics: Conference Series, 190, 1-6.
Document type: Article
Abstract: An analytical approach to the analysis of ReflEXAFS data collected from complex multilayer samples, at a range of angles above and below the critical angle is presented. The aim of the technique is to generate a structural model of the investigated ...
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Cite: López Flores, V., Ansell, S., Ramos, S., Bowron, D.T., Díaz Moreno, S. y Muñoz Páez, A. (2009). Development of ReflEXAFS data analysis for deeper surface structure studies. Journal of Physics: Conference Series, 190, 1-6.
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URI: http://hdl.handle.net/11441/63502

DOI: 10.1088/1742-6596/190/1/012110

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