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Development of ReflEXAFS data analysis for deeper surface structure studies

Opened Access Development of ReflEXAFS data analysis for deeper surface structure studies

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Autor: López Flores, Víctor
Ansell, Stuart
Ramos, Silvia
Bowron, Daniel T.
Díaz Moreno, Sofía
Muñoz Páez, Adela
Departamento: Universidad de Sevilla. Departamento de Química Inorgánica
Fecha: 2009
Publicado en: Journal of Physics: Conference Series, 190, 1-6.
Tipo de documento: Artículo
Resumen: An analytical approach to the analysis of ReflEXAFS data collected from complex multilayer samples, at a range of angles above and below the critical angle is presented. The aim of the technique is to generate a structural model of the investigated system that is consistent with the variable depth sensitivity of the experimental data. The procedure follows three main steps (i) the determination of the free atom reflectivity background for the multilayer system, (ii) the estimation of the depth dependent EXAFS signals and (iii) the calculation of the corresponding ReflEXAFS components. By iterating between steps (ii) and (iii), and varying the estimates of the EXAFS signals, a consistent set of structural parameters is extracted that reflects the bulk structure of the multilayer system through the basic reflectivity signals, and the depth dependent local atomic structure through the estimated EXAFS components. An example of the depth dependent structure of copper in a copper-chromium m...
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Cita: López Flores, V., Ansell, S., Ramos, S., Bowron, D.T., Díaz Moreno, S. y Muñoz Páez, A. (2009). Development of ReflEXAFS data analysis for deeper surface structure studies. Journal of Physics: Conference Series, 190, 1-6.
Tamaño: 417.5Kb
Formato: PDF

URI: http://hdl.handle.net/11441/63502

DOI: 10.1088/1742-6596/190/1/012110

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