Listar Artículos (Tecnología Electrónica) por agencia financiadora 

Listar Artículos (Tecnología Electrónica) por agencia financiadora "Ministerio de Ciencia y Tecnología (MCYT). España"

Mostrando ítems 1-5 de 5

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      Automated performance evaluation of skew-tolerant clocking schemes 

      Guerrero Martos, David; Bellido Díaz, Manuel Jesús; Juan Chico, Jorge; Millán Calderón, Alejandro; Ruiz de Clavijo Vázquez, Paulino; Ostúa Arangüena, Enrique; Viejo Cortés, Julián (Taylor and Francis Online, 2006)
      In this paper the authors evaluate the timing and power performance of three skew-tolerant clocking schemes. These schemes ...
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      Characterization of Normal Propagation Delay for Delay Degradation Model (DDM) 

      Millán Calderón, Alejandro; Juan Chico, Jorge; Bellido Díaz, Manuel Jesús; Ruiz de Clavijo Vázquez, Paulino; Guerrero Martos, David (Springer, 2002-08-27)
      In previous papers we have presented a very accurate model that handles the generation and propagation of glitches, which ...
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      Deployment of Digital Video and Audio Over Electrical SCADA Networks 

      Escudero Fombuena, José Ignacio; Rodríguez, J. A.; Romero Ternero, María del Carmen; Díaz Ruiz, Sergio (IEEE Computer Society, 2005)
      With the arrival of new hardware and software technologies, supervisory control and data acquisition human-machine interfaces ...
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      ESTELLE: A Method to Analyze Automatically the Performance of Telecontrol Protocols in SCADA Systems 

      Medina Rodríguez, Ana Verónica; Gómez González, Isabel María; Luque Rodríguez, Joaquín; Martín Guillén, Sergio (IEEE Computer Society, 2002)
      This paper presents the use of ESTELLE, a formal description technique, as a method to calculate automatically the performance ...
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      Signal Sampling Based Transition Modeling for Digital Gates Characterization 

      Millán Calderón, Alejandro; Juan Chico, Jorge; Bellido Díaz, Manuel Jesús; Ruiz de Clavijo Vázquez, Paulino; Guerrero Martos, David; Ostúa Arangüena, Enrique (Springer, 2004)
      Current characterization methods introduce an important error in the measurement process. In this paper, we present a novel ...