Robust high-accuracy high-speed continuous-time CMOS current comparator

Liñán Cembrano, Gustavo; Río Fernández, Rocío del; Domínguez Castro, Rafael; Rodríguez Vázquez, Ángel Benito

doi:10.1049/el:19971332

Artículo

dc.creator	Liñán Cembrano, Gustavo	es
dc.creator	Río Fernández, Rocío del	es
dc.creator	Domínguez Castro, Rafael	es
dc.creator	Rodríguez Vázquez, Ángel Benito	es
dc.date.accessioned	2020-03-31T14:18:57Z
dc.date.available	2020-03-31T14:18:57Z
dc.date.issued	1997
dc.identifier.citation	Liñán Cembrano, G., Río Fernández, R.d., Domínguez Castro, R. y Rodríguez Vázquez, Á.B. (1997). Robust high-accuracy high-speed continuous-time CMOS current comparator. Electronics Letters, 33 (25), 2082-2084.
dc.identifier.issn	0013-5194	es
dc.identifier.issn	1350-911X	es
dc.identifier.uri	https://hdl.handle.net/11441/94750
dc.description.abstract	The authors present a CMOS current comparator which employs nonlinear negative feedback to obtain high-accuracy (down to 1.5pA) and high-speed for low input currents (8ns at 50nA). The new structure features a speed improvement of more than two orders of magnitude for a 1 nA input current, when compared to the fastest reported to date.	es
dc.format	application/pdf	es
dc.format.extent	3 p.	es
dc.language.iso	eng	es
dc.publisher	Institution of Engineering and Technology	es
dc.relation.ispartof	Electronics Letters, 33 (25), 2082-2084.
dc.rights	Attribution-NonCommercial-NoDerivatives 4.0 Internacional	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/	*
dc.subject	Analogue circuits	es
dc.subject	CMOS integrated circuits	es
dc.subject	Current comparators	es
dc.title	Robust high-accuracy high-speed continuous-time CMOS current comparator	es
dc.type	info:eu-repo/semantics/article	es
dcterms.identifier	https://ror.org/03yxnpp24
dc.type.version	info:eu-repo/semantics/acceptedVersion	es
dc.rights.accessRights	info:eu-repo/semantics/openAccess	es
dc.contributor.affiliation	Universidad de Sevilla. Departamento de Electrónica y Electromagnetismo	es
dc.relation.publisherversion	https://doi.org/10.1049/el:19971332	es
dc.identifier.doi	10.1049/el:19971332	es
dc.journaltitle	Electronics Letters	es
dc.publication.volumen	33	es
dc.publication.issue	25	es
dc.publication.initialPage	2082	es
dc.publication.endPage	2084	es
dc.identifier.sisius	6705942	es

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