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dc.creatorNúñez Martínez, Juanes
dc.creatorAvedillo de Juan, María Josées
dc.date.accessioned2018-04-13T14:37:36Z
dc.date.available2018-04-13T14:37:36Z
dc.date.issued2017
dc.identifier.citationNuñez Martínez, J. y Avedillo de Juan, M.J. (2017). Reducing the Impact of Reverse Currents in Tunnel FET Rectifiers for Energy Harvesting Applications. IEEE Journal of the Electron Devices Society, 5 (6), 530-534.
dc.identifier.issn2168-6734 (impreso)es
dc.identifier.issn2168-6734 (electrónico)es
dc.identifier.urihttps://hdl.handle.net/11441/72857
dc.description.abstractRF to DC passive rectifiers can benefit from the superior performance at low voltage of tunnel transistors. They have shown higher power conversion efficiency (PCE) at low input power than Si FinFETs counterparts. In this paper, we analyze the limitations of typical TFET rectifier topologies associated with the forward biasing of their intrinsic diode and show that this can occur at relatively weak input signals depending on the specific characteristic of the used tunnel device. We propose a simple modification in the implementation of the rectifiers to overcome this problem. The impact of our proposal is evaluated on the widely used gate cross-coupled topology. The proposed designs exhibit similar peak PCE and sensitivity but significantly improve PCE for larger input signal amplitude and larger input poweres
dc.description.sponsorshipMinisterio de Economía y Competitividad TEC2013-40670-Pes
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherInstitute of Electrical and Electronics Engineerses
dc.relation.ispartofIEEE Journal of the Electron Devices Society, 5 (6), 530-534.
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectTunnel transistorses
dc.subjectSteep subthreshold slopees
dc.subjectRectifierses
dc.subjectReverse conductiones
dc.subjectEnergy harvestinges
dc.titleReducing the Impact of Reverse Currents in Tunnel FET Rectifiers for Energy Harvesting Applicationses
dc.typeinfo:eu-repo/semantics/articlees
dcterms.identifierhttps://ror.org/03yxnpp24
dc.type.versioninfo:eu-repo/semantics/acceptedVersiones
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.contributor.affiliationUniversidad de Sevilla. Departamento de Electrónica y Electromagnetismoes
dc.relation.projectIDTEC2013-40670-Pes
dc.relation.publisherversionhttps://doi.org/10.1109/JEDS.2017.2737598es
dc.identifier.doi10.1109/JEDS.2017.2737598es
idus.format.extent4 p.es
dc.journaltitleIEEE Journal of the Electron Devices Societyes
dc.publication.volumen5es
dc.publication.issue6es
dc.publication.initialPage530es
dc.publication.endPage534es
dc.contributor.funderMinisterio de Economía y Competitividad (MINECO). España

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