dc.creator | Millán Calderón, Alejandro | |
dc.creator | Juan Chico, Jorge | |
dc.creator | Bellido Díaz, Manuel Jesús | |
dc.creator | Ruiz de Clavijo Vázquez, Paulino | |
dc.creator | Guerrero Martos, David | |
dc.date.accessioned | 2015-11-25T06:49:35Z | |
dc.date.available | 2015-11-25T06:49:35Z | |
dc.date.issued | 2002-08-27 | |
dc.identifier.citation | Millán Calderón, A., Juan Chico, J., Bellido Díaz, M.J., Ruiz de Clavijo Vázquez, P. y Guerrero Martos, D. (2002). Characterization of Normal Propagation Delay for Delay Degradation Model (DDM). Lecture Notes in Computer Science, 2451, 477-486. | |
dc.identifier.issn | 0302-9743 | es |
dc.identifier.uri | http://hdl.handle.net/11441/31000 | |
dc.description | 12th International Workshop, PATMOS: : International Workshop on Power and Timing Modeling, Optimization and Simulation, Seville, Spain, September 11–13, 2002 ISBN: 978-3-540-44143-4 | |
dc.description.abstract | In previous papers we have presented a very accurate model that handles the generation and propagation of glitches, which makes an important headway in logic timing simulation. This model is called Delay Degradation Model (DDM). Characterizing DDM completely also implies the characterization of the normal propagation delay. In this paper, we propose a simple heuristic model that includes its dependence on the output load and the input transition time. We have tested this model and found a mean deviation lower than 4%. Also, we present a characterization process for this model that is fully integrated into AUTODDM without affecting the total simulation time needed to characterize a standard cell. | es |
dc.description.sponsorship | Ministerio de Ciencia y Tecnología MODEL TIC 2000-1350 | es |
dc.description.sponsorship | Ministerio de Ciencia y Tecnología VERDI TIC 2002-2283 | es |
dc.format | application/pdf | es |
dc.language.iso | eng | es |
dc.publisher | Springer | es |
dc.relation.ispartof | Lecture Notes in Computer Science, 2451, 477-486. | |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | digital circuit | es |
dc.subject | CMOS | es |
dc.subject | propagation delay | es |
dc.subject | glitch | es |
dc.subject | Delay Degradation Model (DDM) | es |
dc.title | Characterization of Normal Propagation Delay for Delay Degradation Model (DDM) | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/acceptedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Tecnología Electrónica | es |
dc.relation.projectID | MODEL TIC 2000-1350 | es |
dc.relation.projectID | VERDI TIC 2002-2283 | es |
dc.relation.publisherversion | https://doi.org/10.1007/3-540-45716-X_48 | es |
dc.identifier.doi | 10.1007/3-540-45716-X_48 | es |
dc.journaltitle | Lecture Notes in Computer Science | es |
dc.publication.volumen | 2451 | es |
dc.publication.initialPage | 477 | es |
dc.publication.endPage | 486 | es |
dc.identifier.idus | https://idus.us.es/xmlui/handle/11441/31000 | |
dc.contributor.funder | Ministerio de Ciencia y Tecnología (MCYT). España | |