dc.creator | Bárcena González, Guillermo | es |
dc.creator | Guerrero Lebrero, María de la Paz | es |
dc.creator | Guerrero Vázquez, Elisa | es |
dc.creator | Yañez, Andres | es |
dc.creator | Nuñez Moraleda, Bernardo Miguel | es |
dc.creator | Fernández Reyes, Daniel | es |
dc.creator | Real Jurado, Pedro | es |
dc.creator | González, David | es |
dc.creator | Galindo Riañ, Pedro Luis | es |
dc.date.accessioned | 2021-09-16T10:36:13Z | |
dc.date.available | 2021-09-16T10:36:13Z | |
dc.date.issued | 2020 | |
dc.identifier.citation | Bárcena González, G., Guerrero Lebrero, M.d.l.P., Guerrero Vázquez, E., Yañez, A., Nuñez Moraleda, B.M., Fernández Reyes, D.,...,Galindo Riaño, P.L. (2020). CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image. Microscopy and Microanalysis, 26 (5), 913-920. | |
dc.identifier.issn | 1431-9276 | es |
dc.identifier.uri | https://hdl.handle.net/11441/125901 | |
dc.description.abstract | In this work, a new method to determine and correct the linear drift for any crystalline orientation in a single-column-resolved high-resolution
scanning transmission electron microscopy (HR-STEM) image, which is based on angle measurements in the Fourier space, is presented.
This proposal supposes a generalization and the improvement of a previous work that needs the presence of two symmetrical planes
in the crystalline orientation to be applicable. Now, a mathematical derivation of the drift effect on two families of asymmetric planes in the
reciprocal space is inferred. However, though it was not possible to find an analytical solution for all conditions, a simple formula was
derived to calculate the drift effect that is exact for three specific rotation angles. Taking this into account, an iterative algorithm based
on successive rotation/drift correction steps is devised to remove drift distortions in HR-STEM images. The procedure has been evaluated
using a simulated micrograph of a monoclinic material in an orientation where all the reciprocal lattice vectors are different. The algorithm
only needs four iterations to resolve a 15° drift angle in the image. | es |
dc.description.sponsorship | Ministerio de Economía y Competitividad MAT2016-77491-C2-2-R | es |
dc.description.sponsorship | Ministerio de Ciencia, Innovación y Universidades TEC2017-86102-C2-2-R | es |
dc.format | application/pdf | es |
dc.format.extent | 8 | es |
dc.language.iso | eng | es |
dc.publisher | Cambridge University Press | es |
dc.relation.ispartof | Microscopy and Microanalysis, 26 (5), 913-920. | |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | Drift correction | es |
dc.subject | Fourier analysis | es |
dc.subject | Image distortion | es |
dc.title | CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image | es |
dc.type | info:eu-repo/semantics/article | es |
dcterms.identifier | https://ror.org/03yxnpp24 | |
dc.type.version | info:eu-repo/semantics/publishedVersion | es |
dc.rights.accessRights | info:eu-repo/semantics/openAccess | es |
dc.contributor.affiliation | Universidad de Sevilla. Departamento de Matemática Aplicada I (ETSII) | es |
dc.relation.projectID | MAT2016-77491-C2-2-R | es |
dc.relation.projectID | TEC2017-86102-C2-2-R | es |
dc.relation.publisherversion | https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/cdrift-an-algorithm-to-correct-linear-drift-from-a-single-highresolution-stem-image/D7854F0D1978F11DEFA555FB039610E1 | es |
dc.identifier.doi | 10.1017/S1431927620001774 | es |
dc.journaltitle | Microscopy and Microanalysis | es |
dc.publication.volumen | 26 | es |
dc.publication.issue | 5 | es |
dc.publication.initialPage | 913 | es |
dc.publication.endPage | 920 | es |
dc.contributor.funder | Ministerio de Economía y Competitividad (MINECO). España | es |
dc.contributor.funder | Ministerio de Ciencia, Innovación y Universidades (MICINN). España | es |