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Tesis Doctoral
Computer Integrated Manufacturing in Semiconductor Industry. Automation, Electronic Wafer Mapping, Defect Reduction and Equipment Utilization Improvement in Probe and Final Test
(2012)
La industria de semiconductores presenta arduos problemas en ... Dispositivos para la industria del automóvil y médica deben tener una tasa de defectos muy baja. Pruebas eléctricas e inspecciones visuales se aplican para ...
Tesis Doctoral
Three-time-scale nonlinear control of an autonomous helicopter on a platform
(2011)
A three-time scale singular perturbation control is applied to an autonomous helicopter model on a platform to regulate its vertical position. Two singularly perturbation time-scale analysis approaches are presented, the ...