Browsing Artículos (Tecnología Electrónica) by Subject "CMOS"
Now showing items 1-3 of 3
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Article
Characterization of Normal Propagation Delay for Delay Degradation Model (DDM)
(Springer, 2002-08-27)In previous papers we have presented a very accurate model that handles the generation and propagation of glitches, which ...
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Article
Monolithic integration of Giant Magnetoresistance (GMR) devices onto standard processed CMOS dies
(Elsevier, 2014)Giant Magnetoresistance (GMR) based technology is nowadays the preferred option for low magnetic fields sensing in disciplines ...
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Article
Signal Sampling Based Transition Modeling for Digital Gates Characterization
(Springer, 2004)Current characterization methods introduce an important error in the measurement process. In this paper, we present a novel ...