Browsing Artículos (Instituto de Microelectrónica de Sevilla (IMSE-CNM)) by Subject "Variability"
Now showing items 1-2 of 2
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Article
A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors
(Elsevier, 2019)Random Telegraph Noise (RTN)has attracted increasing interest in the last years. This phenomenon introduces variability ...
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Article
Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits
(IEEE, 2020)This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS ...