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      A Rad-hard On-chip CMOS Charge Detector with High Dynamic Range 

      Saenz-Noval, Jorge J.; Leñero Bardallo, Juan Antonio; Carmona Galán, Ricardo; Gontard, Lionel C. (Institute of Electrical and Electronics Engineers, 2023)
      This article introduces a CMOS charge detector tailored for measuring ionizing radiation in a wide range of fluences. It ...