Buscar
Mostrando ítems 1-1 de 1
Ponencia
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
(Institute of Electrical and Electronics Engineers, 2004)
In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of ...