Browsing Instituto de Microelectrónica de Sevilla (IMSE-CNM) by Subject "Testability"
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Article
Digital test for the extraction of integrator leakage in first- and second-order ΣΔ modulators
(Institute of Electrical and Electronics Engineers, 2004)This paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator ...