Browsing Instituto de Microelectrónica de Sevilla (IMSE-CNM) by Author 

Browsing Instituto de Microelectrónica de Sevilla (IMSE-CNM) by Author "Pedreira, G."  

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      Unified RTN and BTI statistical compact modeling from a defect-centric perspective 

      Pedreira, G.; Martín Martínez, Javier; Saraza Canflanca, Pablo; Castro-López, Rubén; Rodríguez, R.; Roca, Elisenda; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (Elsevier, 2021-11)
      In nowadays deeply scaled CMOS technologies, time-dependent variability effects have become important concerns for analog ...