Browsing Capítulos (Electrónica y Electromagnetismo) by Author 

Browsing Capítulos (Electrónica y Electromagnetismo) by Author "Ruiz de Clavijo Vázquez, Paulino"              

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      Degradation Delay Model Extension to CMOS Gates 

      Juan Chico, Jorge; Bellido Díaz, Manuel Jesús; Ruiz de Clavijo Vázquez, Paulino; Acosta Jiménez, Antonio José; Valencia Barrero, Manuel (Springer, 2000)
      This contribution extends the Degradation Delay Model (DDM), previously developed for CMOS inverters, to simple logic ...