ListarArtículos (Electrónica y Electromagnetismo) por materia "Nanometrology"
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Artículo
TEMAS: A Flexible Non-AI Algorithm for Metrology of Single-Core and Core-Shell Nanoparticles from TEM Images
(Wiley-Blackwell, 2023)An essential application of electron microscopy is to provide feedback to tune the fabrication of nanoparticles (NPs). ...