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Listar por autor "Saraza Canflanca, Pablo"
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Artículo
A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors
Saraza Canflanca, Pablo; Martin Martinez, J.; Martín Martínez, J.; Castro López, Rafael; Roca Moreno, Elisenda; Rodríguez, R.; Nafria, M.; Fernández Fernández, Francisco Vidal (Elsevier, 2019)Random Telegraph Noise (RTN)has attracted increasing interest in the last years. This phenomenon introduces variability ...
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A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level
Saraza Canflanca, Pablo; Díaz Fortuny, J.; Castro López, R.; Roca, E.; Martín Martínez, J.; Rodríguez, R.; Nafria, M.; Fernández Fernández, Francisco Vidal (Elsevier B.V., 2020-05)In the past few years, Time-Dependent Variability has become a subject of growing concern in CMOS technologies. In particular, ...
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Artículo
Flexible Setup for the Measurement of CMOS Time-Dependent Variability with Array-Based Integrated Circuits
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Castro Lopez, Rafael; Roca, Elisenda; Martin Martinez, Javier; Rodriguez, Rosana; Fernández Fernández, Francisco Vidal; Nafria, Montserrat (IEEE, 2020)This paper presents an innovative and automated measurement setup for the characterization of variability effects in CMOS ...
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Artículo
Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging
Santana-Andreo, Andrés; Saraza Canflanca, Pablo; Castro López, R.; Roca, E.; Fernández Fernández, Francisco Vidal (ELSEVIER GMBH, 2024)Physical Unclonable Functions (PUFs) have gained attention as a lightweight hardware security primitive. In particular, ...